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b) an observed powder x-ray diffraction pattern
substantially in accordance with the pattern shown
in Figure 1;
c) a simulated powder x-ray diffraction pattern
substantially in accordance with the pattern shown
in Figure 1,
d) a powder x-ray diffraction pattern (CuK alpha
gamma=1.5418 Å) comprising four or more 2 theta
values selected from: 5.4±0.1, 8.6±0.l, 9.7±0.l, 12.4±0.1,
14.9±0.1, 17.6±0.l, 18.1±0.1, 20.5±0.1, 21.4±0.1, and
22.0±0.1, wherein measurement of the crystalline form
is at a temperature of about 25°C; and/or