temperature of about 25° C;
b) an observed powder x-ray diffraction pattern
substantially in accordance with the pattern shown
in Figure ... simulated powder x-ray diffraction pattern
substantially in accordance with the pattern shown
in Figure 1,
d) a powder x-ray diffraction pattern (CuK alpha
temperature of about 25° C;
b) an observed powder x-ray diffraction pattern
substantially in accordance with the pattern shown
in Figure ... simulated powder x-ray diffraction pattern
substantially in accordance with the pattern shown
in Figure 1,
d) a powder x-ray diffraction pattern (CuK alpha
infringed. The plaintiffs will also have to
disclose to Court the x-ray diffraction data of the
product, particularly if it is a pharmaceutical drug ... entire specification of the patent
held by the plaintiff together with X-ray diffraction
data of Tarceva and Erlocip filed along with the
plaint
submission that the plaintiff was bound
to disclose the X-ray diffraction pattern of the claims in the suit
patent and of Ceritinib was also ... Rules 1 and 2 of the CPC , the Court cannot
examine X-ray diffraction patterns.
(xii) The reliance of the defendant on the fact that
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Author: Bhargav D. Karia
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